ATE Test Program Development
- Experienced team with broad range of capabilities (hardware, software, PCB design, application and product engineering, project management)
- Reliable, experienced, proven track record
- Fast turnaround time
- Test strategy planning (hardware, software, choice of equipment, instruments and accessories)
- Customized hardware solutions including PCB design, FPGA, CPLD
- Development of innovative methods to push the limits of instrument performance
- Ultra-low noise measurements (down to 130 dBm)
- Low-noise, low-distortion signal conditioning, filtering and measurement
- Crosstalk, SSO, PDN (Power Distribution ) analysis
- Expertise in different ATE systems like HP93000, Ultraflex, Catalyst and IP750EX
- Implemented test solutions for a variety of IC blocks including Image sensors, SerDes, WLAN, Bluetooth, FM, PCI, USB, SDIO, Switching Regulators, LDOs, Memory
- Developed ATE Image Sensor tests for projects on Ultraflex, Catalyst, and IP750EX
- ATE Image Sensor test post-processing
Data Analysis & Test Infrastructure Development
- Tester-to-bench and tester-to-tester correlation
- Repeatability studies
- Failure root cause analysis
- Test data analysis and post-processing
- Yield evaluation
- Yield estimates
- Providing "golden reference" data
Program Development and Production Testing at:
- EAG, Santa Clara, CA
- StatsChipPAC Inc, Milpitas, CA
- ISE Labs Inc, Fremont, CA
- Jazz Semiconductor Inc, Newport Beach, CA
- Sigurd Microelectronics
- Various other test houses and company sites
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